Model NO.
OSG65R099HSZAF TO247
Trademark
Orientalsemiconductor
Origin
China
HS Code
854129000
Production Capacity
20kkkk/Monthly
Certification:
RoHS
Description:
Extremely Low Switching Loss
Characteristics:
Excellent Stability and Uniformity
Applications:
PC Power
Industries:
LED Lighting
Transport Package:
Air
General Description
The GreenMOS® high voltage MOSFET utilizes charge balance technology to achieve outstanding low on-resistance and lower gate charge. It is engineered to minimize conduction loss, provide superior switching performance and robust avalanche capability.
The GreenMOS® Z series is integrated with fast recovery diode (FRD) to minimize reverse recovery time. It is suitable for resonant switching topologies to reach higher efficiency, higher reliability and smaller form factor.
Features
Applications
Key Performance Parameters
Marking Information
The HTRB test was performed at 600V more strictly than the AEC-Q101 rev.C (80% V(BR)DSS). All the other tests were performed according to AEC Q101 rev. E.
Dynamic Characteristics
Gate Charge Characteristics
Body Diode Characteristics
Note
The GreenMOS® high voltage MOSFET utilizes charge balance technology to achieve outstanding low on-resistance and lower gate charge. It is engineered to minimize conduction loss, provide superior switching performance and robust avalanche capability.
The GreenMOS® Z series is integrated with fast recovery diode (FRD) to minimize reverse recovery time. It is suitable for resonant switching topologies to reach higher efficiency, higher reliability and smaller form factor.
Features
- Low RDS(on) & FOM
- Extremely low switching loss
- Excellent stability and uniformity
- Ultra-fast and robust body diode
- AEC-Q101 Qualified for Automotive Application
Applications
- PC power
- Telecom power
- Server power
- EV Charger
- Motor driver
Key Performance Parameters
Parameter | Value | Unit |
VDS | 650 | V |
ID, pulse | 96 | A |
RDS(ON), max @ VGS=10V | 99 | mΩ |
Qg | 66.6 | nC |
Marking Information
Product Name | Package | Marking |
OSG65R099HSZAF | TO247 | OSG65R099HSZA |
The HTRB test was performed at 600V more strictly than the AEC-Q101 rev.C (80% V(BR)DSS). All the other tests were performed according to AEC Q101 rev. E.
Absolute Maximum Ratings at Tj=25°C unless otherwise noted
Thermal Characteristics
Electrical Characteristics at Tj=25°C unless otherwise specified
Parameter | Symbol | Value | Unit |
Drain-source voltage | VDS | 650 | V |
Gate-source voltage | VGS | ±30 | V |
Continuous drain current1), TC=25 °C | ID | 32 | A |
Continuous drain current1), TC=100 °C | 20 | ||
Pulsed drain current2), TC=25 °C | ID, pulse | 96 | A |
Continuous diode forward current1), TC=25 °C | IS | 32 | A |
Diode pulsed current2), TC=25 °C | IS, pulse | 96 | A |
Power dissipation3) ,TC=25 °C | PD | 278 | W |
Single pulsed avalanche energy5) | EAS | 648 | mJ |
MOSFET dv/dt ruggedness, VDS=0…480 V | dv/dt | 50 | V/ns |
Reverse diode dv/dt, VDS=0…480 V, ISD≤ID | dv/dt | 50 | V/ns |
Operation and storage temperature | Tstg, Tj | -55 to 150 | °C |
Thermal Characteristics
Parameter | Symbol | Value | Unit |
Thermal resistance, junction-case | RθJC | 0.45 | °C/W |
Thermal resistance, junction-ambient4) | RθJA | 62 | °C/W |
Electrical Characteristics at Tj=25°C unless otherwise specified
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Drain-source breakdown voltage | BVDSS | 650 | V | VGS=0 V, ID=1 mA | ||
Gate threshold voltage | VGS(th) | 3.0 | 4.5 | V | VDS=VGS, ID=1 mA | |
Drain-source on- state resistance | RDS(ON) | 0.090 | 0.099 | Ω | VGS=10 V, ID=16 A | |
0.21 | VGS=10 V, ID=16 A, Tj=150 °C | |||||
Gate-source leakage current | IGSS | 100 | nA | VGS=30 V | ||
-100 | VGS=-30 V | |||||
Drain-source leakage current | IDSS | 10 | μA | VDS=650 V, VGS=0 V | ||
Gate resistance | RG | 7.8 | Ω | ƒ=1 MHz, Open drain |
Dynamic Characteristics
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Input capacitance | Ciss | 3988 | pF | VGS=0 V, VDS=50 V, ƒ=100 kHz | ||
Output capacitance | Coss | 210 | pF | |||
Reverse transfer capacitance | Crss | 7.4 | pF | |||
Effective output capacitance, energy related | Co(er) | 124 | pF | VGS=0 V, VDS=0 V-400 V | ||
Effective output capacitance, time related | Co(tr) | 585 | pF | |||
Turn-on delay time | td(on) | 46.0 | ns | VGS=10 V, VDS=400 V, RG=2 Ω, ID=20 A | ||
Rise time | tr | 60.3 | ns | |||
Turn-off delay time | td(off) | 93.0 | ns | |||
Fall time | tf | 3.7 | ns |
Gate Charge Characteristics
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Total gate charge | Qg | 66.6 | nC | VGS=10 V, VDS=400 V, ID=20 A | ||
Gate-source charge | Qgs | 20.6 | nC | |||
Gate-drain charge | Qgd | 24.8 | nC | |||
Gate plateau voltage | Vplateau | 6.7 | V |
Body Diode Characteristics
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test condition |
Diode forward voltage | VSD | 1.3 | V | IS=32 A, VGS=0 V | ||
Reverse recovery time | trr | 151.7 | ns | IS=20 A, di/dt=100 A/μs | ||
Reverse recovery charge | Qrr | 1.0 | μC | |||
Peak reverse recovery current | Irrm | 12.3 | A |
Note
- Calculated continuous current based on maximum allowable junction temperature.
- Repetitive rating; pulse width limited by max. junction temperature.
- Pd is based on max. junction temperature, using junction-case thermal resistance.
- VDD=100 V, VGS=10 V, L=80 mH, starting Tj=25 °C.
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